Intelligent sensing for real time metrology

Imaging is the basis of a multitude of scientific and industrial experimental procedures. Electron microscopy, for example, is widely used to obtain images at submicron and atomic scales of materials with applications in semiconductors, energy, medicine, and biology. In this project, new sensing methods are developed for electron microscopes with high speed data compression, using new asynchronous pixelated sensors and image processing in the focal plane.

MICINN Plan Nacional (Generación de Conocimiento)
Team: 2 researchers
Duration: Jan 2018-Dec 2021
Quantity: 47.000 €
IP: Lionel Cervera Gontard
Ref: PGC2018-101538-A-I00